Transitions radiatives du cœur à la bande de valence dans les cristaux CsCl et CsCaCl2MEL'CHAKOV, E.N; RODNYJ, P.A; RYBAKOV, B.V et al.Fizika tverdogo tela. 1989, Vol 31, Num 5, pp 276-278, issn 0367-3294Article

Surface quantitative analysis of Cr-O systems by XPSBATTISTONI, C; COSSU, G; MATTOGNO, G et al.Surface and interface analysis. 1983, Vol 5, Num 4, pp 173-176, issn 0142-2421Article

X-ray absorption and X-ray photoelectron spectroscopy of a rhodium colloidROTHE, J; POLLMANN, J; FRANKE, R et al.Fresenius' journal of analytical chemistry. 1996, Vol 355, Num 3-4, pp 372-374, issn 0937-0633Conference Paper

Quantitative XPS analysis considering elastic scatteringEBEL, H; EBEL, M. F; WERNISCH, J et al.Surface and interface analysis. 1984, Vol 6, Num 3, pp 140-143, issn 0142-2421Article

Metal overlayers on organic functional groups of self-organized molecular assemblies. II: X-ray photoelectron spectroscopy of interactions of Cu/CN on 12-mercaptododecanenitrileJUNG, D. R; KING, D. E; CZANDERNA, A. W et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1993, Vol 11, Num 4, pp 2382-2386, issn 0734-2101, 2Conference Paper

XPS: energy calibration of electron spectrometers. II: Results of an interlaboratory comparisonANTHONY, M. T; SEAH, M. P.Surface and interface analysis. 1984, Vol 6, Num 3, pp 107-115, issn 0142-2421Article

Surface characterization of chrysotile asbestos by X-ray photoelectron spectroscopy and scanning Auger spectroscopyPATHAK, B; SEBASTIEN, P.Canadian journal of spectroscopy. 1985, Vol 30, Num 1, pp 1-6, issn 0045-5105Article

Effects of elastic photoelectron collisions in quantitative XPSJABLONSKI, A; EBEL, H.Surface and interface analysis. 1984, Vol 6, Num 1, pp 21-28, issn 0142-2421Article

XPS: energy calibration of electron spectrometers. I: An absolute, traceable energy calibration and the provision of atomic reference line energiesANTHONY, M. T; SEAH, M. P.Surface and interface analysis. 1984, Vol 6, Num 3, pp 95-106, issn 0142-2421Article

X-ray photoelectron spectroscopy study of the surface composition of CoO-MgO solid solutionsCIMINO, A; DE ANGELIS, B. A; MINELLI, G et al.Surface and interface analysis. 1983, Vol 5, Num 4, pp 150-154, issn 0142-2421Article

The antioxidation effect of boron oxide on a pyocarbonCHESNEAU, M; BEGUIN, F; CONARD, J et al.Carbon (New York, NY). 1992, Vol 30, Num 4, pp 714-716, issn 0008-6223Article

He(I) photoelectron studies of lidocaine films on liquid surfacesBALLARD, R. E; JONES, J; READ, D et al.Chemical physics letters. 1988, Vol 144, Num 2, pp 114-118, issn 0009-2614Article

Quantitative surface analysis by XPS: a comparison among different quantitative approachesBATTISTONI, C; MATTOGNO, G; PAPARAZZO, E et al.Surface and interface analysis. 1985, Vol 7, Num 3, pp 117-121, issn 0142-2421Article

Small area X-ray photoelectron spectroscopyYATES, K; WEST, R. H.Surface and interface analysis. 1983, Vol 5, Num 5, pp 217-221, issn 0142-2421Article

Surface modification and characterization of carbon black with oxygen plasmaTAKADA, T; NAKAHARA, M; KUMAGAI, H et al.Carbon (New York, NY). 1996, Vol 34, Num 9, pp 1087-1091, issn 0008-6223Article

Calibration of an X-ray photoelectron spectrometer by means of noble metalsEBEL, M. F; EBEL, H; ZUBA, G et al.Surface and interface analysis. 1983, Vol 5, Num 4, pp 170-172, issn 0142-2421Article

Electronegativity scale from X-ray photoelectron spectroscopic dataHUSAIN, M; ALKA BATRA; SRIVASTAVA, K. S et al.Polyhedron. 1989, Vol 8, Num 9, pp 1233-1237, issn 0277-5387Article

Surface analysis of supported heterogeneous catalystsHERCULES, D. M.TrAC. Trends in analytical chemistry (Regular ed.). 1984, Vol 3, Num 5, pp 125-129, issn 0165-9936Article

XPS for in situ observation of an Ag electrode on a solid electrolyte used as oxygen sensorARAKAWA, T; SAITO, A; SHIOKAWA, J et al.Chemical physics letters. 1983, Vol 94, Num 3, pp 250-252, issn 0009-2614Article

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X-RAY PHOTOELECTRON ANALYSIS OF SURFACE LAYERS WITH COMPOSITION GRADIENTSNEFEDOV VI.1981; SURF. INTERFACE ANAL.; ISSN 0142-2421; GBR; DA. 1981; VOL. 3; NO 2; PP. 72-75; BIBL. 9 REF.Article

SURFACE ANALYSIS OF INSB BY X-RAY PHOTOELECTRON SPECTROSCOPY (XPS).COPPERTHWAITE RG; KUNZE OA; LLOYD J et al.1978; Z. NATURFORSCH., A; DTSCH.; DA. 1978; VOL. 33; NO 5; PP. 523-527; BIBL. 15 REF.Article

USEFULNESS OF PHOTON MASS ATTENUATION COEFFICIENTS IN ELEMENTAL ANALYSISKOURIS K; SPYROU NM.1978; NUCL. INSTRUM. METHODS; NLD; DA. 1978; VOL. 153; NO 2-3; PP. 477-483; BIBL. 11 REF.Article

A NEW METHOD FOR DETERMINING SULFOXIDES IN PEPTIDE MOLECULES USING X-RAY PHOTOELECTRON SPECTROSCOPYJONES D; DISTEFANO G; TONIOLO C et al.1978; BIOPOLYMERS; USA; DA. 1978; VOL. 17; NO 11; PP. 2703-2713; BIBL. 47 REF.Article

QUANTITATIVE ANALYSIS BY X-RAY PHOTOELECTRON SPECTROSCOPY WITHOUT REFERENCE SAMPLESEBEL MF; EBEL H; HIROKAWA K et al.1982; SPECTROCHIM. ACTA, B: AT. SPECTROSC.; ISSN 0584-8547; GBR; DA. 1982; VOL. 37; NO 6; PP. 461-471; BIBL. 33 REF.Article